Differences between revisions 8 and 31 (spanning 23 versions)
⇤ ← Revision 8 as of 2008-11-21 14:37:19 →
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← Revision 31 as of 2009-07-07 16:47:21 → ⇥
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 *[[http://gw.icrr.u-tokyo.ac.jp:8888/clio_blog/2008/11/081109rf-intensity-noise-080626.html|(2008/10/29 by 新井)]]


 [[target|{{attachment:n081029_4-thumb-555x407.jpg}}]]
 [[attachment:n081029_4.pdf]]


 *周波数雑音: inline armのerror信号を1e12[V/m], cavity pole 248Hzで換算してプロット。換算係数は100kHz付近のスペクトル形状が変位雑音と一致するように選んだ。8kHz以上で感度を制限。
 *ショット雑音・検出系雑音: inline/perpendのPDのgdet, idetより復調出力に現れるショット雑音電圧・検出系雑音電圧を計算し、これを干渉計の応答および上記周波数雑音の応答で換算。500Hz~8kHzで感度を制限。(若干perp shot noiseは若干推定にズレがあるようだが)
 *[[FeedbackFilter|フィルタ雑音]]: [[http://gw.icrr.u-tokyo.ac.jp:8888/clio_blog/2008/10/mass-filter-circuit-noise.html|前出]]のフィルタの入力換算雑音vnを補正。error basedの感度、feedback basedの感度でフィルタ雑音の現れ方が変わる。ライン以外では今は問題なし。
  *feedback basedの場合: dx_filerr = vn / H (Hは干渉計の応答)
  *error basedの場合: dx_filfb = vn G / H (Gはopenloop伝達関数)		 = CLIO target sensitivity at room temperature =

CLIO target sensitivity at room temperature

CLIO/NoiseBudgets/RoomTemperature (last edited 2009-07-07 16:47:21 by whitehole)