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* Birefringence measurements at NAOJ:  * Birefringence measurements at NAOJ:

Participants : M. Eisenmann, D. Haba, S. Lee, M. Otsuka, K. Somiya, K. Takeshita, R. Watanabe, K. Yamamoto

  • Birefringence measurements at NAOJ:

new AZTEC samples (30 mm diameter) : birefringence seems good (10**-7 or below) and limited by holder's stress Currently 3D printing new holders that should remove stress iLM/LMA sample have larger birefringence iLM starts to sell sapphire substrates

  • Parametric instabilities :

Can simulate TEM00 but some issues with HOMs discussion with Hiro Yamamoto planned

  • Coating measurement at U. Toyama :

NAOJ coating measurement slightly postoned due to He leakage (restart next week) New actuator/transducer designed (half area of previous one with similar pattern electrodes)

  • new ITMs HCB bonding preparation at U. Toyama :

planned for 2026 currently preparing the cleanroom

  • ASC with birefringence at TiTech :

computing SN of jitter vs QPD shot-noise checking with optimized QPDs 4 split PD simulation with finesse on-going

  • absorption measurement at KASI :

setting up the PCI

KAGRA/Subgroups/MIR/Meetings/Minutes20241113 (last edited 2024-12-03 20:02:54 by marc.eisenmann)