Diff for "LCGT/Meeting/Reviews/External"

Differences between revisions 17 and 18

External Review (in English)

Date: April 17(Tue) - April 20(Fri), 2012

Location and access: ICRR U-tokyo, Kashiwa campus, 6F large conference room http://www.icrr.u-tokyo.ac.jp/access/index_eng.html

Note for presenters (in Japanese)

1. Overview
- 1-1. Definition and scope of the subsystem
  - （該当サブシステムの一般的な定義、特にどのサブシステムに属するか明白でない項目についても明記）
- 1-2. Important interface
  - （該当サブシステムと他のサブシステムとの間のインターフェースについての一般的な記述、特に重要なものについては詳述）
- 1-3. Design phase
  - （iLCGTの最終設計、bLCGTの予備設計という範疇に入らないものを明記）
2. iLCGT
- 2-1. Target specifications（目標仕様、重要なスペックだけでよい）
- 2-2. Final design
- 2-3. Schedule
- 2-4. Quality assurance（購入・製作物品の性能確認方法）
- 2-5. Installation scenario
- 2-6. Risk management（各リスクを可能性と重大さに応じて評価、対策を講じる（SEMP参照））
3. bLCGT
- 3-1. Requirements
- 3-2. Preliminary design
- 3-3. Schedule
- 3-4. Prototype test (if any)（予備設計の妥当性を確かめるためのプロトタイプテストの計画）
- 3-5. Quality assurance
- 3-6. Installation scenario
- 3-7. Risk management
Appendix
- A. Design changes that have been made with the suggestions in the 1st external review (if any)
  - （前回の外部レビューで推奨された案件に従って設計の変更を行ったものを列挙）
  - B. Items that have been reduced in cost (if any) （以前の設計でオーバースペックだったが、予算削減のためにスペックダウンした項目

Date: February 28(Mon) - March 4(Fri), 2011

Location and access: ICRR U-tokyo, Kashiwa campus, 6F large conference room

http://www.icrr.u-tokyo.ac.jp/access/index_eng.html

Review documents

Subgroup name	Document number

Analog Electronics	JGW-T1100364
Cryogenics	JGW-T1100366
Data Analysis	JGW-T1100367
Detector Configuration	JGW-T1100368
Digital system	JGW-T1100359
Input Output Optics	JGW-T1100369
Laser	JGW-T1100370
Main Interferometer	JGW-T1100363
Mirror	JGW-T1100371
Tunnel	JGW-T1100362
Vacuum	JGW-T1100372
Vibration Isolation	JGW-T1100365

Program

2/28
Time	Title	Speaker	File

9:50-10:05	Opening Talk	T. Kajita
10:05-10:10	Introduction of External Review	S. Kawamura	JGW-M1100374
10:10-12:00	Detector Configuration & Roadmap 1	K. Somiya, M. Ando	JGW-G1100375
	Lunch
13:30-15:30	Detector Configuration & Roadmap 2	K. Somiya, M. Ando	JGW-G1100377
	Coffee Break
16:00-18:00	Data Analysis	N. Kanda	JGW-G1100378

3/1
Time	Title	Speaker	File

10:00-12:00	Main Interferometer 1	Y. Aso	JGW-G1100379
	Lunch
13:30-14:30	Main Interferometer 2	Y. Aso	JGW-G1100379
	Coffee Break
15:00-17:00	Input/Output Optics	S. Talada	JGW-G1100380

3/2
Time	Title	Speaker	File

10:00-12:00	Vibration Isolation 1	R. Takahashi	JGW-G1100383
	Lunch
13:30-14:30	Cryogenics	T. Suzuki	JGW-G1100387
14:30-15:00	Vacuum	Y. Saito	JGW-G1100381
15:00-16:00	Tunnel	T. Uchiyama	JGW-G1100382
	Coffee Break
Extra talk 1	CLIO	T. Uchiyama	JGW-G1100390
Extra talk 2	TAMA SAS	R. Takahashi	JGW-G1100389
17:30-18:00	Geophysics Interferometer	A. Araya	JGW-G1100384

3/3
Time	Title	Speaker	File

10:00-11:00	Laser	N. Mio	JGW-G1100392
11:00-12:00	Mirror	N. Mio	JGW-G1100391
	Lunch
13:30-14:15	Analog Electronics	S. Moriwaki	JGW-G1100393
14:15-15:00	Digital System	O. Miyakawa	JGW-G1100388
15:00-15:30	Vibration Isolation 2	R. DeSalvo	JGW-G1100385
	Break
18:00-20:00	Banquet

3/4

10:00-12:00	Discussion among reviewers 1
	Lunch
13:30-15:30	Discussion among reviewers 2
	Adjourn

Reviewers

Name	Affiliation	Remarks
Masaki Ando	LCGT/ Kyoto University	Deputy chief of secretariat
Stefan Ballmer	LSC/ Syracuse University
Alessandro Bertolini	LSC/ Albert-Einstein-Institut Hannover
Raffaele Flaminio	Virgo/ Laboratoire des Matériaux Avancés
Andreas Freise	GEO/ University of Birmingham
Warren Johnson	LSC/ Louisiana State University
Seiji Kawamura	LCGT/ ICRR, NAOJ	Chief of secretariat
David Ottaway	ACIGA/ University of Adelaide
Benno Willke	GEO/ Leibniz Universität Hannover
Michael E. Zucker	LIGO-Lab/ Massachusetts Institute of Technology	Chair

-  ⇤ ← Revision 17 as of 2012-01-24 17:44:47 → 
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-  *2-1. Target specifications
   （目標仕様、重要なスペックだけでよい）
+  *2-1. Target specifications（目標仕様、重要なスペックだけでよい）
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-  *2-4. Quality assurance
   （購入・製作物品の性能確認方法）
+  *2-4. Quality assurance（購入・製作物品の性能確認方法）
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+Line 27:
-  *2-6. Risk management
   （各リスクを可能性と重大さに応じて評価、対策を講じる（SEMP参照））
+  *2-6. Risk management（各リスクを可能性と重大さに応じて評価、対策を講じる（SEMP参照））
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+Line 32:
-  *3-4. Prototype test (if any)
   （予備設計の妥当性を確かめるためのプロトタイプテストの計画）
+  *3-4. Prototype test (if any)（予備設計の妥当性を確かめるためのプロトタイプテストの計画）