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|| '''[[LCGT|PROJECT TOP]]''' ||[[LCGT/subgroup/analysis|GW Analysis]] ||[[LCGT/subgroup/ifo|Interferometer]] ||[[LCGT/subgroup/vacuum|Vacuum & Cryostat]] ||[[LCGT/subgroup/laser|Laser & Optics]] ||[[LCGT/subgroup/vis|Seismic Isolator]] ||[[LCGT/subgroup/infra|Infrastructure]] || | = 各作業部会 = |
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= LCGT組織、及び各作業部会 = == News == o --(Interface Control Document の策定:5月末〆切、黒田SL まで提出。)-- |
||インフラ|| ||[[LCGT/subgroup/mine|坑内外整備]]|| ||[[ |ICD]]|| || || ||[[LCGT/subgroup/crust|基線伸縮系]]|| ||[[ |ICD]]|| || || || || || || ||真空・低温・防振|| ||[[LCGT/subgroup/vacuum|真空装置・クライオスタット]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=21|ICD]]|| || || ||[[LCGT/subgroup/vis|防振系(VIS)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=26|ICD]]|| || || ||[[LCGT/subgroup/lowtemp|冷凍機]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=25|ICD]]|| || || || || || || ||[[LCGT/subgroup/ifo|干渉計]]|| ||[[LCGT/subgroup/ifo/ISC|干渉計制御(ISC)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=9|ICD]]|| || || ||[[LCGT/subgroup/ifo/digital|デジタル制御(digital)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=10|ICD]]|| || || ||[[LCGT/subgroup/ifo/support|干渉計サポート]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=11|ICD1]], [[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=12|ICD2]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=13|ICD3]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=14|ICD4]]|| || || || || || || ||光学素子|| ||[[LCGT/subgroup/laser|安定化レーザー]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=7|ICD]]|| || || ||[[LCGT/subgroup/ioo|入射光学系]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=8|ICD]]|| || || || || || || ||[[LCGT/subgroup/analysis|データ解析]]|| ||[[LCGT/subgroup/analysis/gw_search|Data Analysis (DAS)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=17|ICD]]|| || || ||[[LCGT/subgroup/analysis/data_center|Analysis Center (ACS)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=16|ICD]]|| || || ||[[LCGT/subgroup/analysis/daq|Data Acquisition (DAQ)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=15|ICD]]|| |
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[[LCGT/subgroup/list|LCGT 組織図]] o [[LCGT/subgroup/ICD|Interface Control Document]] ---- *インフラ *[[LCGT/subgroup/mine|坑内外整備]] *[[LCGT/subgroup/crust|基線伸縮系]] *真空・低温・防振 *[[LCGT/subgroup/vacuum|真空装置・クライオスタット]] *[[LCGT/subgroup/vis|防振系(VIS)]] *[[LCGT/subgroup/lowtemp|冷凍機]] *[[LCGT/subgroup/ifo|干渉計]] *[[LCGT/subgroup/ifo/ISC|干渉計制御(ISC)]] *[[LCGT/subgroup/ifo/digital|デジタル制御(digital)]] *[[LCGT/subgroup/ifo/support|干渉計サポート]] *[[LCGT/subgroup/ifo/BW|干渉計帯域幅]] *[[LCGT/subgroup/ifo/SPI|SPI]] *光学素子 *[[LCGT/subgroup/laser|安定化レーザー]] *[[LCGT/subgroup/ioo|入射光学系]] *[[LCGT/subgroup/analysis|データ解析]] *[[LCGT/subgroup/analysis/gw_search|Data Analysis (DAS)]] *[[LCGT/subgroup/analysis/data_center|Analysis Center (ACS)]] *[[LCGT/subgroup/analysis/daq|Data Acquisition (DAQ)]] |
== Past subgroup == ||[[LCGT/subgroup/ifo/BW|干渉計帯域幅]]|| ||[[LCGT/subgroup/ifo/SPI|SPI]]|| |
各作業部会
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Past subgroup