Differences between revisions 32 and 42 (spanning 10 versions)
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Revision 42 as of 2010-04-15 12:13:36
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|| '''[[LCGT|PROJECT TOP]]''' ||[[LCGT/subgroup/analysis|GW Analysis]] ||[[LCGT/subgroup/ifo|Interferometer]] ||[[LCGT/subgroup/vacuum|Vacuum & Cryostat]] ||[[LCGT/subgroup/laser|Laser & Optics]] ||[[LCGT/subgroup/vis|Seismic Isolator]] ||[[LCGT/subgroup/infra|Infrastructure]] || = 各作業部会 =
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= LCGT組織、及び各作業部会 = ||インフラ|| ||[[LCGT/subgroup/mine|坑内外整備]]|| ||[[ |ICD]]||
|| || ||[[LCGT/subgroup/crust|基線伸縮系]]|| ||[[ |ICD]]||
|| || || || || ||
||真空・低温・防振|| ||[[LCGT/subgroup/vacuum|真空装置・クライオスタット]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=21|ICD]]||
|| || ||[[LCGT/subgroup/vis|防振系(VIS)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=26|ICD]]||
|| || ||[[LCGT/subgroup/lowtemp|冷凍機]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=25|ICD]]||
|| || || || || ||
||[[LCGT/subgroup/ifo|干渉計]]|| ||[[LCGT/subgroup/ifo/ISC|干渉計制御(ISC)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=9|ICD]]||
|| || ||[[LCGT/subgroup/ifo/digital|デジタル制御(digital)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=10|ICD]]||
|| || ||[[LCGT/subgroup/ifo/support|干渉計サポート]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=11|ICD1]], [[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=12|ICD2]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=13|ICD3]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=14|ICD4]]||
|| || || || || ||
||光学素子|| ||[[LCGT/subgroup/laser|安定化レーザー]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=7|ICD]]||
|| || ||[[LCGT/subgroup/ioo|入射光学系]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=8|ICD]]||
|| || ||[[LCGT/subgroup/mirror|鏡]]|| ||[[ |ICD]]||
|| || || || || ||
||[[LCGT/subgroup/analysis|データ解析]]|| ||[[LCGT/subgroup/analysis/gw_search|Data Analysis (DAS)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=17|ICD]]||
|| || ||[[LCGT/subgroup/analysis/data_center|Analysis Center (ACS)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=16|ICD]]||
|| || ||[[LCGT/subgroup/analysis/daq|Data Acquisition (DAQ)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=15|ICD]]||
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[[LCGT/subgroup/list|LCGT 組織図]]

o [[LCGT/subgroup/ICD|Interface Control Document]]
== Past subgroup ==
||[[LCGT/subgroup/ifo/BW|干渉計帯域幅]]||
||[[LCGT/subgroup/ifo/SPI|SPI]]||
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||インフラ|| ||[[LCGT/subgroup/mine|坑内外整備]]|| ||ICD||
|| || ||[[LCGT/subgroup/crust|基線伸縮系]]|| ||ICD||
|| || || ||
||真空・低温・防振|| ||[[LCGT/subgroup/vacuum|真空装置・クライオスタット]]||
|| || ||[[LCGT/subgroup/vis|防振系(VIS)]]||
|| || ||[[LCGT/subgroup/lowtemp|冷凍機]]||
|| || || ||
||[[LCGT/subgroup/ifo|干渉計]]|| ||[[LCGT/subgroup/ifo/ISC|干渉計制御(ISC)]]||
|| || ||[[LCGT/subgroup/ifo/digital|デジタル制御(digital)]]||
|| || ||[[LCGT/subgroup/ifo/support|干渉計サポート]]||
|| || ||[[LCGT/subgroup/ifo/BW|干渉計帯域幅]]||
|| || ||[[LCGT/subgroup/ifo/SPI|SPI]]||
|| || || ||
||光学素子|| ||[[LCGT/subgroup/laser|安定化レーザー]]||
|| || ||[[LCGT/subgroup/ioo|入射光学系]]||
|| || || ||
||[[LCGT/subgroup/analysis|データ解析]]|| ||[[LCGT/subgroup/analysis/gw_search|Data Analysis (DAS)]]||
|| || ||[[LCGT/subgroup/analysis/data_center|Analysis Center (ACS)]]||
|| || ||[[LCGT/subgroup/analysis/daq|Data Acquisition (DAQ)]]||

----

[[LCGT/subgroup/howtojoin|各サブグループへの参加の仕方]]
 .[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=18|Interface Control Document (ICDまとめ)]]
 .[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=19|ICD template]]
 .[[LCGT/subgroup/howtojoin|各サブグループへの参加の仕方]]

LCGT/subgroup (last edited 2010-11-08 01:14:01 by KentaroSomiya)