Differences between revisions 43 and 78 (spanning 35 versions)

iLCGT subsystem wiki page

Infrastructure	Tunnel	ICD
	Facility Support
	Baseline Monitoring Interferometer (基線伸縮系)	ICD

真空・低温・防振	Vacuum System (真空装置)	ICD
	Vibration Isolation and Suspension (防振・懸架系)	ICD
	Cryostat (クライオスタット)	ICD
	Cryocooler (冷凍機)	ICD

Interferometer	Interferometer Support	ICD1, ICD2,ICD3,ICD4
	Interferometer Sensing and Control (ISC)	ICD
	Digital Control (digital)	ICD
	Electronics
	Optical Configuration Group

Optical Systems	Pre-Stabilized Laser (PSL)	ICD
	Input Optics(入射光学系)	ICD
	Large Optics	ICD

Analysis	Data Analysis (DAS)	ICD
	Data Acquisition (DAQ)	ICD
	Analysis Center (ACS)	ICD

Interface Control Document (ICDまとめ)
ICD template
各サブグループへの参加の仕方

-  ⇤ ← Revision 43 as of 2010-04-15 12:18:17 → 
  Size: 2598
  Editor: OsamuMiyakawa
  Comment:
+   ← Revision 78 as of 2010-11-04 17:43:02 → ⇥
  Size: 2844
  Editor: KentaroSomiya
  Comment:
-Deletions are marked like this.
+Additions are marked like this.
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-= 各作業部会 =
+= iLCGT subsystem wiki page =
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-||インフラ|| ||[[LCGT/subgroup/mine|坑内外整備]]|| ||[[ |ICD]]||
|| || ||[[LCGT/subgroup/crust|基線伸縮系]]|| ||[[ |ICD]]||
|| || || || || ||
||真空・低温・防振|| ||[[LCGT/subgroup/vacuum|真空装置・クライオスタット]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=21|ICD]]||
|| || ||[[LCGT/subgroup/vis|防振・懸架系(VIS)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=26|ICD]]||
|| || ||[[LCGT/subgroup/lowtemp|冷凍機]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=25|ICD]]||
|| || || || || ||
|| || ||[[LCGT/subgroup/ifo/support|干渉計サポート]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=11|ICD1]], [[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=12|ICD2]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=13|ICD3]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=14|ICD4]]||
||[[LCGT/subgroup/ifo|干渉計]]|| ||[[LCGT/subgroup/ifo/ISC|干渉計制御(ISC)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=9|ICD]]||
|| || ||[[LCGT/subgroup/ifo/digital|デジタル制御(digital)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=10|ICD]]||
|| || || || || ||
||光学素子|| ||[[LCGT/subgroup/laser|安定化レーザー]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=7|ICD]]||
|| || ||[[LCGT/subgroup/ioo|入射光学系]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=8|ICD]]||
|| || ||[[LCGT/subgroup/mirror|鏡設計・製作]]|| ||[[　|ICD]]||
|| || || || || ||
||[[LCGT/subgroup/analysis|データ解析]]|| ||[[LCGT/subgroup/analysis/gw_search|Data Analysis (DAS)]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=17|ICD]]||
|| || ||[[LCGT/subgroup/analysis/daq|データ収集系 (Data Acquisition (DAQ))]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=15|ICD]]||
|| || ||[[LCGT/subgroup/analysis/data_center|解析センター (Analysis Center (ACS))]]|| ||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=16|ICD]]||
+||Infrastructure|| ||[[LCGT/subgroup/mine|Tunnel]]||[[ |ICD]]||
||     || || [[LCGT/subgroup/mine |Facility Support]] || ||
|| || ||[[LCGT/subgroup/crust|Baseline Monitoring Interferometer (基線伸縮系)]]||[[ |ICD]]||
|| || || || ||
||真空・低温・防振|| ||[[LCGT/subgroup/vacuum|Vacuum System (真空装置)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=26|ICD]]||
|| || ||[[LCGT/subgroup/vis|Vibration Isolation and Suspension (防振・懸架系)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=88|ICD]]||
|| || ||[[LCGT/subgroup/vacuum|Cryostat (クライオスタット)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=91|ICD]]||
|| || ||[[LCGT/subgroup/lowtemp|Cryocooler (冷凍機)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=25|ICD]]||
|| || || || ||
||[[LCGT/subgroup/ifo|Interferometer]]|| ||[[LCGT/subgroup/ifo/support|Interferometer Support]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=11|ICD1]], [[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=12|ICD2]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=13|ICD3]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=14|ICD4]]||
|| || ||[[LCGT/subgroup/ifo/ISC|Interferometer Sensing and Control (ISC)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=9|ICD]]||
|| || ||[[LCGT/subgroup/ifo/digital|Digital Control (digital)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=10|ICD]]||
|| || || [[LCGT/subgroup/Electronics|Electronics]]      || ||
|| || || [[LCGT/subgroup/OCG|Optical Configuration Group]]      || ||
|| || || || ||
|| Optical Systems || ||[[LCGT/subgroup/laser|Pre-Stabilized Laser (PSL)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=7|ICD]]||
|| || ||[[LCGT/subgroup/ioo|Input Optics(入射光学系)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=90|ICD]]||
|| || ||[[LCGT/subgroup/mirror|Large Optics]]||[[　|ICD]]||
|| || || || ||
||[[LCGT/subgroup/analysis|Analysis]]|| ||[[LCGT/subgroup/analysis/gw_search|Data Analysis (DAS)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=17|ICD]]||
|| || ||[[LCGT/subgroup/analysis/daq|Data Acquisition (DAQ)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=15|ICD]]||
|| || ||[[LCGT/subgroup/analysis/data_center|Analysis Center (ACS)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=16|ICD]]||
-Line 23:
+Line 27:
-== Past subgroup ==
||[[LCGT/subgroup/ifo/BW|干渉計帯域幅]]||
||[[LCGT/subgroup/ifo/SPI|SPI]]||
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