Differences between revisions 53 and 78 (spanning 25 versions)

iLCGT subsystem wiki page

Infrastructure	Tunnel	ICD
	Facility Support
	Baseline Monitoring Interferometer (基線伸縮系)	ICD

真空・低温・防振	Vacuum System (真空装置)	ICD
	Vibration Isolation and Suspension (防振・懸架系)	ICD
	Cryostat (クライオスタット)	ICD
	Cryocooler (冷凍機)	ICD

Interferometer	Interferometer Support	ICD1, ICD2,ICD3,ICD4
	Interferometer Sensing and Control (ISC)	ICD
	Digital Control (digital)	ICD
	Electronics
	Optical Configuration Group

Optical Systems	Pre-Stabilized Laser (PSL)	ICD
	Input Optics(入射光学系)	ICD
	Large Optics	ICD

Analysis	Data Analysis (DAS)	ICD
	Data Acquisition (DAQ)	ICD
	Analysis Center (ACS)	ICD

Interface Control Document (ICDまとめ)
ICD template
各サブグループへの参加の仕方

-  ⇤ ← Revision 53 as of 2010-06-17 11:24:58 → 
  Size: 2828
  Editor: OsamuMiyakawa
  Comment:
+   ← Revision 78 as of 2010-11-04 17:43:02 → ⇥
  Size: 2844
  Editor: KentaroSomiya
  Comment:
-Deletions are marked like this.
+Additions are marked like this.
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-= 各作業部会 =
+= iLCGT subsystem wiki page =
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-||インフラ|| ||[[LCGT/subgroup/mine|坑内外整備]]||[[ |ICD]]||
|| || ||[[LCGT/subgroup/crust|基線伸縮系]]||[[ |ICD]]||
+||Infrastructure|| ||[[LCGT/subgroup/mine|Tunnel]]||[[ |ICD]]||
||     || || [[LCGT/subgroup/mine |Facility Support]] || ||
|| || ||[[LCGT/subgroup/crust|Baseline Monitoring Interferometer (基線伸縮系)]]||[[ |ICD]]||
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+Line 7:
-||真空・低温・防振|| ||[[LCGT/subgroup/vacuum|真空装置]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=26|ICD]]||
|| || ||[[LCGT/subgroup/vis|防振・懸架系(VIS)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=88|ICD]]||
|| || ||[[LCGT/subgroup/vacuum|クライオスタット]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=91|ICD]]||
|| || ||[[LCGT/subgroup/lowtemp|冷凍機]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=25|ICD]]||
+||真空・低温・防振|| ||[[LCGT/subgroup/vacuum|Vacuum System (真空装置)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=26|ICD]]||
|| || ||[[LCGT/subgroup/vis|Vibration Isolation and Suspension (防振・懸架系)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=88|ICD]]||
|| || ||[[LCGT/subgroup/vacuum|Cryostat (クライオスタット)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=91|ICD]]||
|| || ||[[LCGT/subgroup/lowtemp|Cryocooler (冷凍機)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=25|ICD]]||
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+Line 12:
-||[[LCGT/subgroup/ifo|干渉計]]|| ||[[LCGT/subgroup/ifo/support|干渉計サポート]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=11|ICD1]], [[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=12|ICD2]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=13|ICD3]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=14|ICD4]]||
|| || ||[[LCGT/subgroup/ifo/ISC|干渉計制御(ISC)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=9|ICD]]||
|| || ||[[LCGT/subgroup/ifo/digital|デジタル制御(digital)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=10|ICD]]||
+||[[LCGT/subgroup/ifo|Interferometer]]|| ||[[LCGT/subgroup/ifo/support|Interferometer Support]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=11|ICD1]], [[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=12|ICD2]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=13|ICD3]],[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=14|ICD4]]||
|| || ||[[LCGT/subgroup/ifo/ISC|Interferometer Sensing and Control (ISC)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=9|ICD]]||
|| || ||[[LCGT/subgroup/ifo/digital|Digital Control (digital)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=10|ICD]]||
|| || || [[LCGT/subgroup/Electronics|Electronics]]      || ||
|| || || [[LCGT/subgroup/OCG|Optical Configuration Group]]      || ||
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-||光学素子|| ||[[LCGT/subgroup/laser|安定化レーザー]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=7|ICD]]||
|| || ||[[LCGT/subgroup/ioo|入射光学系]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=90|ICD]]||
|| || ||[[LCGT/subgroup/mirror|鏡設計・製作]]||[[　|ICD]]||
+|| Optical Systems || ||[[LCGT/subgroup/laser|Pre-Stabilized Laser (PSL)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=7|ICD]]||
|| || ||[[LCGT/subgroup/ioo|Input Optics(入射光学系)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=90|ICD]]||
|| || ||[[LCGT/subgroup/mirror|Large Optics]]||[[　|ICD]]||
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+Line 22:
-||[[LCGT/subgroup/analysis|データ解析]]|| ||[[LCGT/subgroup/analysis/gw_search|Data Analysis (DAS)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=17|ICD]]||
|| || ||[[LCGT/subgroup/analysis/daq|データ収集系 (Data Acquisition (DAQ))]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=15|ICD]]||
|| || ||[[LCGT/subgroup/analysis/data_center|解析センター (Analysis Center (ACS))]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=16|ICD]]||
+||[[LCGT/subgroup/analysis|Analysis]]|| ||[[LCGT/subgroup/analysis/gw_search|Data Analysis (DAS)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=17|ICD]]||
|| || ||[[LCGT/subgroup/analysis/daq|Data Acquisition (DAQ)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=15|ICD]]||
|| || ||[[LCGT/subgroup/analysis/data_center|Analysis Center (ACS)]]||[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/DocDB/ShowDocument?docid=16|ICD]]||
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-== 特別作業部会 ==
||[[LCGT/subgroup/ifo/BW|干渉計帯域幅]]||
||[[LCGT/subgroup/ifo/SPI|SPI]]||
||[[LCGT/subgroup/ifo/RSERoadMap|RSEロードマップ]]||
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 .[[http://gw.icrr.u-tokyo.ac.jp/cgi-bin/private/DocDB/ShowDocument?docid=121|組織図(2010/6/15現在)]]